Self-testing VLSI design /

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Bibliographic Details
Main Author: Yarmolik, Viacheslav Nikolaevich
Other Authors: Kachan, I. V.
Format: Book
Language:English
Published: Amsterdam : Elsevier, 1993
Edition:[1st ed.]
Subjects:
mikroelektronika > náhodné testovanie > pseudonáhodné testovanie
ISBN:0444896406
Online Access: Get full text
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Description
Physical Description:XI, 345 s. : grafy, lit., obr., tab. ;
ISBN:0444896406

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