Self-testing VLSI design /

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Bibliographic Details
Main Author:	Yarmolik, Viacheslav Nikolaevich
Other Authors:	Kachan, I. V.
Format:	Book
Language:	English
Published:	Amsterdam : Elsevier, 1993
Edition:	[1st ed.]
Subjects:	mikroelektronika > náhodné testovanie > pseudonáhodné testovanie
ISBN:	0444896406
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Holdings details from CVTI sklad absenčný
Call Number:	A540763
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