High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliabilit...

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Bibliographic Details
Main Author: Wang, Zheng (Author)
Format: Electronic eBook
Language:English
Published: Singapore : Springer Singapore , 2018.
Edition:1st ed. 2018.
Series:Computer Architecture and Design Methodologies,
Subjects:
ISBN:9789811010736
ISSN:2367-3478
Online Access: Get full text
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Summary:This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures. .
Item Description:Engineering
Physical Description:XX, 197 p. 104 illus., 72 illus. in color. online resource.
ISBN:9789811010736
ISSN:2367-3478