High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliabilit...

Full description

Saved in:
Bibliographic Details
Main Author: Wang, Zheng (Author)
Format: Electronic eBook
Language:English
Published: Singapore : Springer Singapore , 2018.
Edition:1st ed. 2018.
Series:Computer Architecture and Design Methodologies,
Subjects:
ISBN:9789811010736
ISSN:2367-3478
Online Access: Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!

Internet

Get full text

CVTI internet

Holdings details from CVTI internet
Call Number: ZE07337
Copy On Shelf