Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization /
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron mi...
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| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
Singapore :
Springer Singapore ,
2018.
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| Ausgabe: | 1st ed. 2018. |
| Schriftenreihe: | SpringerBriefs in Applied Sciences and Technology,
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| Schlagworte: | |
| ISBN: | 9789811044335 |
| ISSN: | 2191-530X |
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| 041 | |a eng | ||
| 100 | 1 | |a Brodusch, Nicolas. |4 aut | |
| 245 | 1 | 0 | |a Field Emission Scanning Electron Microscopy |h [electronic resource] : |b New Perspectives for Materials Characterization / |c by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin. |
| 250 | |a 1st ed. 2018. | ||
| 260 | 1 | |a Singapore : |b Springer Singapore , |c 2018. | |
| 300 | |a XII, 137 p. 53 illus., 20 illus. in color. |b online resource. | ||
| 490 | 1 | |a SpringerBriefs in Applied Sciences and Technology, |x 2191-530X | |
| 500 | |a Chemistry and Materials Science | ||
| 516 | |a text file PDF | ||
| 520 | |a This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage. | ||
| 650 | 0 | |a Materials science. | |
| 650 | 0 | |a Spectroscopy. | |
| 650 | 0 | |a Microscopy. | |
| 650 | 0 | |a Nanotechnology. | |
| 856 | 4 | 0 | |u http://hanproxy.cvtisr.sk/han/cvti-ebook-springer-eisbn-978-981-10-4433-5 |y Vzdialený prístup pre registrovaných používateľov |
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| 919 | |a 978-981-10-4433-5 | ||
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