Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization /

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron mi...

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Bibliographic Details

Main Author:	Brodusch, Nicolas (Author)
Format:	Electronic eBook
Language:	English
Published:	Singapore : Springer Singapore , 2018.
Edition:	1st ed. 2018.
Series:	SpringerBriefs in Applied Sciences and Technology,
Subjects:	Materials science. Spectroscopy. Microscopy. Nanotechnology.
ISBN:	9789811044335
ISSN:	2191-530X
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