Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization /
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron mi...
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| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
Singapore :
Springer Singapore ,
2018.
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| Ausgabe: | 1st ed. 2018. |
| Schriftenreihe: | SpringerBriefs in Applied Sciences and Technology,
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| Schlagworte: | |
| ISBN: | 9789811044335 |
| ISSN: | 2191-530X |
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| Zusammenfassung: | This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage. |
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| Beschreibung: | Chemistry and Materials Science |
| Beschreibung: | XII, 137 p. 53 illus., 20 illus. in color. online resource. |
| ISBN: | 9789811044335 |
| ISSN: | 2191-530X |