Timing Performance of Nanometer Digital Circuits Under Process Variations
This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming us...
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| Hlavní autor: | |
|---|---|
| Médium: | Elektronický zdroj E-kniha |
| Jazyk: | angličtina |
| Vydáno: |
Cham :
Springer International Publishing,
2018.
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| Vydání: | 1st ed. 2018. |
| Edice: | Frontiers in Electronic Testing,
39 |
| Témata: | |
| ISBN: | 9783319754659 |
| ISSN: | 0929-1296 ; |
| On-line přístup: |
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Obsah:
- Introduction
- Mathematical Fundamentals
- Process Variations
- Gate delay under process variations
- Path Delay Under Process Variations
- Circuit Analysis under Process Variations
- FinFET Technology and design issues.