Timing Performance of Nanometer Digital Circuits Under Process Variations
This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming us...
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| Main Author: | |
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| Format: | Electronic eBook |
| Language: | English |
| Published: |
Cham :
Springer International Publishing,
2018.
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| Edition: | 1st ed. 2018. |
| Series: | Frontiers in Electronic Testing,
39 |
| Subjects: | |
| ISBN: | 9783319754659 |
| ISSN: | 0929-1296 ; |
| Online Access: |
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