Claeys, C. (2018). Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (1st ed. 2018.). Springer International Publishing.
Citace podle Chicago (17th ed.)Claeys, Cor. Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact. 1st ed. 2018. Cham: Springer International Publishing, 2018.
Citace podle MLA (9th ed.)Claeys, Cor. Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact. 1st ed. 2018. Springer International Publishing, 2018.
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