Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials /

This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signa...

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Bibliographic Details
Main Author: Breitenstein, Otwin (Author)
Format: Electronic eBook
Language:English
Published: Cham : Springer International Publishing, 2018.
Edition:3rd ed. 2018.
Series:Springer Series in Advanced Microelectronics, 10
Subjects:
Lasers.
Photonics.
Materials science.
Microwaves.
Optical engineering.
Structural materials.
ISBN:9783319998251
ISSN:1437-0387 ;
Online Access: Get full text
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Summary:This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
Item Description:Physics and Astronomy
Physical Description:XXI, 321 p. 126 illus., 68 illus. in color. online resource.
ISBN:9783319998251
ISSN:1437-0387 ;

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