Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials /

This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signa...

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Bibliographic Details

Main Author:	Breitenstein, Otwin (Author)
Format:	Electronic eBook
Language:	English
Published:	Cham : Springer International Publishing, 2018.
Edition:	3rd ed. 2018.
Series:	Springer Series in Advanced Microelectronics, 10
Subjects:	Lasers. Photonics. Materials science. Microwaves. Optical engineering. Structural materials.
ISBN:	9783319998251
ISSN:	1437-0387 ;
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