APA (7th ed.) Citation

Breitenstein, O. (2018). Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (3rd ed. 2018.). Springer International Publishing.

Chicago Style (17th ed.) Citation

Breitenstein, Otwin. Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials. 3rd ed. 2018. Cham: Springer International Publishing, 2018.

MLA (9th ed.) Citation

Breitenstein, Otwin. Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials. 3rd ed. 2018. Springer International Publishing, 2018.