ATOM-PROBE FIELD. ION MICROSCOPY AND ITS APPLICATIONS /

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Bibliographic Details
Main Author:	Sakurai, Toshio
Other Authors:	Sakai, A., Pickering, H. W., Hawkes, P. W.
Format:	Book
Language:	English
Published:	Boston : Academic Press, 1989
Subjects:	iónová optika odborné publikácie
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Holdings details from CVTI sklad absenčný
Call Number:	A507814
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