Design and test technology for dependable systems-on-chip /

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Bibliographic Details
Other Authors:	Ubar, Raimund 1941- (Editor), Raik, Jaan, 1972- (Editor), Vierhaus, Heinrich Theodor (Editor)
Format:	Book
Language:	English
Published:	Hershey, PA : IGI Global, 2011
Subjects:	vstavaný systém vstavaný mikroprocesor digitálny systém diagnostické modelovanie simulácia chýb testovanie pamäte elektronické dokumenty odborné publikácie
ISBN:	9781609602147
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Call Number:	ZE00128
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