Citace podle APA (7th ed.)

Strong, A. W. (2009). Reliability wearout mechanisms in advanced CMOS technologies ([1st ed.].). IEEE Press.

Citace podle Chicago (17th ed.)

Strong, Alvin W. Reliability Wearout Mechanisms in Advanced CMOS Technologies. [1st ed.]. Piscataway: IEEE Press, 2009.

Citace podle MLA (9th ed.)

Strong, Alvin W. Reliability Wearout Mechanisms in Advanced CMOS Technologies. [1st ed.]. IEEE Press, 2009.

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