Yue, J. T., & Thong, J. (2002). 9th international symposium on the physical and failure analysis of integrated circuits: Proceedings, Singapore, 8 - 12 July 2002 ([1st ed.].). Institute of Electrical and Electronics Engineers.
Citácia podle Chicago (17th ed.)Yue, John T., a J. Thong. 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits: Proceedings, Singapore, 8 - 12 July 2002. [1st ed.]. Piscataway: Institute of Electrical and Electronics Engineers, 2002.
Citácia podľa MLA (8th ed.)Yue, John T., a J. Thong. 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits: Proceedings, Singapore, 8 - 12 July 2002. [1st ed.]. Institute of Electrical and Electronics Engineers, 2002.
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