9th international symposium on the physical and failure analysis of integrated circuits : Proceedings, Singapore, 8 - 12 July 2002 /

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Bibliographic Details
Main Author: Yue, John T.
Corporate Author: Proceedings
Other Authors: Thong, J. (Editor)
Format: Conference Proceeding Book
Language:English
Published: Piscataway : Institute of Electrical and Electronics Engineers, 2002
Edition:[1st ed.]
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ISBN:0780374169
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Call Number: A584005
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