Electromigration and electronic device degradation /

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Bibliographic Details
Main Author: Christou, Aris
Format: Book
Language:English
Published: New York : John Wiley & Sons, 1994
Edition:[1st ed.]
Subjects:
integrovaný obvod > VLSI > polovodič > elektrodifúzia > spoľahlivosť > simulácia > počítačový model
ISBN:0471584894
Online Access: Get full text
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