State-of-the-art electron beams for compact tools of ultrafast science
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| Názov: | State-of-the-art electron beams for compact tools of ultrafast science |
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| Autori: | Salén, Peter, Opanasenko, Anatoliy, Perosa, Giovanni, Goryashko, Vitaliy, 1982 |
| Zdroj: | Ultramicroscopy. 268 |
| Predmety: | Ultrafast electron diffraction, Inverse compton scattering, Velocity bunching |
| Popis: | We review state-of-the-art electron beams for single-shot megaelectronvolt ultrafast electron diffraction (MeVUED) and compact light sources. Our primary focus is on sub-100 femtosecond electron bunches in the 2-30 MeV energy range. We demonstrate that our new and recent simulation results permit significantly improved bunch parameters for these applications. |
| Popis súboru: | electronic |
| Prístupová URL adresa: | https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-545733 https://doi.org/10.1016/j.ultramic.2024.114080 |
| Databáza: | SwePub |
Nájsť tento článok vo Web of Science | Abstrakt: | We review state-of-the-art electron beams for single-shot megaelectronvolt ultrafast electron diffraction (MeVUED) and compact light sources. Our primary focus is on sub-100 femtosecond electron bunches in the 2-30 MeV energy range. We demonstrate that our new and recent simulation results permit significantly improved bunch parameters for these applications. |
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| DOI: | 10.1016/j.ultramic.2024.114080 |