Morphology of Buried Interfaces in Ion-Assisted Magnetron Sputter-Deposited 11B4C-Containing Ni/Ti Multilayer Neutron Optics Investigated by Grazing-Incidence Small-Angle Scattering

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Title: Morphology of Buried Interfaces in Ion-Assisted Magnetron Sputter-Deposited 11B4C-Containing Ni/Ti Multilayer Neutron Optics Investigated by Grazing-Incidence Small-Angle Scattering
Authors: Stendahl, Sjoerd, Ghafoor, Naureen, Schwartzkopf, Matthias, Zubayer, Anton, Birch, Jens, Eriksson, Fredrik
Source: ACS Applied Materials and Interfaces. 16(17):22665-22675
Subject Terms: neutron optics, Ni/Ti, multilayer, ion-assisted magnetron sputter deposition, grazing-incidencesmall-angle X-ray scattering, GISAXS, interfacemorphology, neutron reflectivity, X-ray reflectivity
Description: Multilayer neutron optics require precise control of interface morphology for optimal performance. In this work, we investigate the effects of different growth conditions on the interface morphology of Ni/Ti-based multilayers, with a focus on incorporating low-neutron-absorbing (B4C)-B-11 and using different ion assistance schemes. Grazing-incidence small-angle X-ray scattering was used to probe the structural and morphological details of buried interfaces, revealing that the layers become more strongly correlated and the interfaces form mounds with increasing amounts of (B4C)-B-11. Applying high flux ion assistance during growth can reduce mound formation but lead to interface mixing, while a high flux modulated ion assistance scheme with an initial buffer layer grown at low ion energy and the top layer at higher ion energy prevents intermixing. The optimal condition was found to be adding 26.0 atom % (B4C)-B-11 combined with high flux modulated ion assistance. A multilayer with a period of 48.2 & Aring; and 100 periods was grown under these conditions, and coupled fitting to neutron and X-ray reflectivity data revealed an average interface width of only 2.7 & Aring;, a significant improvement over the current state-of-the-art commercial Ni/Ti multilayers. Overall, our study demonstrates that the addition of (B4C)-B-11 and the use of high flux modulated ion assistance during growth can significantly improve the interface morphology of Ni/Ti multilayers, leading to improved neutron optics performance.
File Description: electronic
Access URL: https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-205185
https://liu.diva-portal.org/smash/get/diva2:1875868/FULLTEXT01.pdf
Database: SwePub
Description
Abstract:Multilayer neutron optics require precise control of interface morphology for optimal performance. In this work, we investigate the effects of different growth conditions on the interface morphology of Ni/Ti-based multilayers, with a focus on incorporating low-neutron-absorbing (B4C)-B-11 and using different ion assistance schemes. Grazing-incidence small-angle X-ray scattering was used to probe the structural and morphological details of buried interfaces, revealing that the layers become more strongly correlated and the interfaces form mounds with increasing amounts of (B4C)-B-11. Applying high flux ion assistance during growth can reduce mound formation but lead to interface mixing, while a high flux modulated ion assistance scheme with an initial buffer layer grown at low ion energy and the top layer at higher ion energy prevents intermixing. The optimal condition was found to be adding 26.0 atom % (B4C)-B-11 combined with high flux modulated ion assistance. A multilayer with a period of 48.2 & Aring; and 100 periods was grown under these conditions, and coupled fitting to neutron and X-ray reflectivity data revealed an average interface width of only 2.7 & Aring;, a significant improvement over the current state-of-the-art commercial Ni/Ti multilayers. Overall, our study demonstrates that the addition of (B4C)-B-11 and the use of high flux modulated ion assistance during growth can significantly improve the interface morphology of Ni/Ti multilayers, leading to improved neutron optics performance.
ISSN:19448244
19448252
DOI:10.1021/acsami.4c01457