Patterns for Java Program Testing
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| Title: | Patterns for Java Program Testing |
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| Authors: | Marco Torchiano |
| Contributors: | The Pennsylvania State University CiteSeerX Archives |
| Source: | http://softeng.polito.it/torchiano/papers/WTiXP2002.pdf. |
| Collection: | CiteSeerX |
| Description: | The NIH (Not Invented Here) syndrome often appears in software development; it makes people keep reinventing the wheel all the time. Fortunately the recent trend is to reuse existing solutions either as software component or as known designs. Patterns fall into this latter category. Patterns are reusable solution to known problems in a well-defined context [2]. |
| Document Type: | text |
| File Description: | application/pdf |
| Language: | English |
| Relation: | http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.490.2394; http://softeng.polito.it/torchiano/papers/WTiXP2002.pdf |
| Availability: | http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.490.2394 http://softeng.polito.it/torchiano/papers/WTiXP2002.pdf |
| Rights: | Metadata may be used without restrictions as long as the oai identifier remains attached to it. |
| Accession Number: | edsbas.C076AA4D |
| Database: | BASE |
Nájsť tento článok vo Web of Science | Abstract: | The NIH (Not Invented Here) syndrome often appears in software development; it makes people keep reinventing the wheel all the time. Fortunately the recent trend is to reuse existing solutions either as software component or as known designs. Patterns fall into this latter category. Patterns are reusable solution to known problems in a well-defined context [2]. |
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