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All-du-path coverage for parallel programs

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Title: All-du-path coverage for parallel programs
Authors: Yang, Cheer-Sun D., Souter, Amie L., Pollock, Lori L.
Source: ACM SIGSOFT Software Engineering Notes ; volume 23, issue 2, page 153-162 ; ISSN 0163-5948
Publisher Information: Association for Computing Machinery (ACM)
Publication Year: 1998
Description: One significant challenge in bringing the power of parallel machines to application programmers is providing them with a suite of software tools similar to the tools that sequential programmers currently utilize. In particular, automatic or semi-automatic testing tools for parallel programs are lacking. This paper describes our work in automatic generation of all-du-paths for testing parallel programs. Our goal is to demonstrate that, with some extension, sequential test data adequacy criteria are still applicable to parallel program testing. The concepts and algorithms in this paper have been incorporated as the foundation of our DELaware PArallel Software Testing Aid, della pasta.
Document Type: article in journal/newspaper
Language: English
DOI: 10.1145/271775.271804
Availability: https://doi.org/10.1145/271775.271804
https://dl.acm.org/doi/10.1145/271775.271804
https://dl.acm.org/doi/pdf/10.1145/271775.271804
Rights: https://www.acm.org/publications/policies/copyright_policy#Background
Accession Number: edsbas.95CC537D
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  – Url: https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=EBSCO&SrcAuth=EBSCO&DestApp=WOS&ServiceName=TransferToWoS&DestLinkType=GeneralSearchSummary&Func=Links&author=Yang%20CD
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Header DbId: edsbas
DbLabel: BASE
An: edsbas.95CC537D
RelevancyScore: 824
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PreciseRelevancyScore: 823.78955078125
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: All-du-path coverage for parallel programs
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Yang%2C+Cheer-Sun+D%2E%22">Yang, Cheer-Sun D.</searchLink><br /><searchLink fieldCode="AR" term="%22Souter%2C+Amie+L%2E%22">Souter, Amie L.</searchLink><br /><searchLink fieldCode="AR" term="%22Pollock%2C+Lori+L%2E%22">Pollock, Lori L.</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: ACM SIGSOFT Software Engineering Notes ; volume 23, issue 2, page 153-162 ; ISSN 0163-5948
– Name: Publisher
  Label: Publisher Information
  Group: PubInfo
  Data: Association for Computing Machinery (ACM)
– Name: DatePubCY
  Label: Publication Year
  Group: Date
  Data: 1998
– Name: Abstract
  Label: Description
  Group: Ab
  Data: One significant challenge in bringing the power of parallel machines to application programmers is providing them with a suite of software tools similar to the tools that sequential programmers currently utilize. In particular, automatic or semi-automatic testing tools for parallel programs are lacking. This paper describes our work in automatic generation of all-du-paths for testing parallel programs. Our goal is to demonstrate that, with some extension, sequential test data adequacy criteria are still applicable to parallel program testing. The concepts and algorithms in this paper have been incorporated as the foundation of our DELaware PArallel Software Testing Aid, della pasta.
– Name: TypeDocument
  Label: Document Type
  Group: TypDoc
  Data: article in journal/newspaper
– Name: Language
  Label: Language
  Group: Lang
  Data: English
– Name: DOI
  Label: DOI
  Group: ID
  Data: 10.1145/271775.271804
– Name: URL
  Label: Availability
  Group: URL
  Data: https://doi.org/10.1145/271775.271804<br />https://dl.acm.org/doi/10.1145/271775.271804<br />https://dl.acm.org/doi/pdf/10.1145/271775.271804
– Name: Copyright
  Label: Rights
  Group: Cpyrght
  Data: https://www.acm.org/publications/policies/copyright_policy#Background
– Name: AN
  Label: Accession Number
  Group: ID
  Data: edsbas.95CC537D
PLink https://erproxy.cvtisr.sk/sfx/access?url=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edsbas&AN=edsbas.95CC537D
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1145/271775.271804
    Languages:
      – Text: English
    Titles:
      – TitleFull: All-du-path coverage for parallel programs
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Yang, Cheer-Sun D.
      – PersonEntity:
          Name:
            NameFull: Souter, Amie L.
      – PersonEntity:
          Name:
            NameFull: Pollock, Lori L.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 01
              Type: published
              Y: 1998
          Identifiers:
            – Type: issn-locals
              Value: edsbas
            – Type: issn-locals
              Value: edsbas.oa
          Titles:
            – TitleFull: ACM SIGSOFT Software Engineering Notes ; volume 23, issue 2, page 153-162 ; ISSN 0163-5948
              Type: main
ResultId 1