All-du-path coverage for parallel programs
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| Title: | All-du-path coverage for parallel programs |
|---|---|
| Authors: | Yang, Cheer-Sun D., Souter, Amie L., Pollock, Lori L. |
| Source: | ACM SIGSOFT Software Engineering Notes ; volume 23, issue 2, page 153-162 ; ISSN 0163-5948 |
| Publisher Information: | Association for Computing Machinery (ACM) |
| Publication Year: | 1998 |
| Description: | One significant challenge in bringing the power of parallel machines to application programmers is providing them with a suite of software tools similar to the tools that sequential programmers currently utilize. In particular, automatic or semi-automatic testing tools for parallel programs are lacking. This paper describes our work in automatic generation of all-du-paths for testing parallel programs. Our goal is to demonstrate that, with some extension, sequential test data adequacy criteria are still applicable to parallel program testing. The concepts and algorithms in this paper have been incorporated as the foundation of our DELaware PArallel Software Testing Aid, della pasta. |
| Document Type: | article in journal/newspaper |
| Language: | English |
| DOI: | 10.1145/271775.271804 |
| Availability: | https://doi.org/10.1145/271775.271804 https://dl.acm.org/doi/10.1145/271775.271804 https://dl.acm.org/doi/pdf/10.1145/271775.271804 |
| Rights: | https://www.acm.org/publications/policies/copyright_policy#Background |
| Accession Number: | edsbas.95CC537D |
| Database: | BASE |
Nájsť tento článok vo Web of Science | Abstract: | One significant challenge in bringing the power of parallel machines to application programmers is providing them with a suite of software tools similar to the tools that sequential programmers currently utilize. In particular, automatic or semi-automatic testing tools for parallel programs are lacking. This paper describes our work in automatic generation of all-du-paths for testing parallel programs. Our goal is to demonstrate that, with some extension, sequential test data adequacy criteria are still applicable to parallel program testing. The concepts and algorithms in this paper have been incorporated as the foundation of our DELaware PArallel Software Testing Aid, della pasta. |
|---|---|
| DOI: | 10.1145/271775.271804 |