Quantitative assessment of ohmic-type CdTe sensor response in a photon-counting X-ray imaging detector under continuous 12–49 keV irradiations
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| Titel: | Quantitative assessment of ohmic-type CdTe sensor response in a photon-counting X-ray imaging detector under continuous 12–49 keV irradiations |
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| Autoren: | Fabienne Orsini, Yasuhiko Imai, Takaki Hatsui |
| Quelle: | J Synchrotron Radiat Journal of Synchrotron Radiation, Vol 32, Iss 4, Pp 951-960 (2025) |
| Verlagsinformationen: | International Union of Crystallography (IUCr), 2025. |
| Publikationsjahr: | 2025 |
| Schlagwörter: | synchrotron radiation experiments, cadmium telluride sensors, Crystallography, QD901-999, Nuclear and particle physics. Atomic energy. Radioactivity, hybrid pixels, QC770-798, absorbed doses, Research Papers, polarization effects, x-ray irradiation |
| Beschreibung: | For several years, photon-counting X-ray imaging detectors with cadmium telluride (CdTe) sensors have been used in high-energy synchrotron experiments. While these detectors exhibit excellent detection sensitivity at high energy, concerns remain regarding their performance stability over time under exposure to high-energy X-rays, an issue that can be critical for certain experiments. This study aims to quantitatively assess the response of ohmic-type CdTe sensors under well defined conditions of continuous X-ray irradiation, considering dose rate, photon energy and average absorbed dose throughout the sensor depth. Measurements were performed in a laboratory environment using a dedicated setup with a reliable and reproducible measurement protocol. The results revealed significant irradiation-induced performance variations over time. Notably, a loss of more than 11% in photon counts was observed, even at a relatively low photon flux of 5000 photons s−1 pixel−1 at 49 keV. The key contribution of this work is a quantitative characterization of the behavior of CdTe sensors within the 12–49 keV energy range under controlled conditions. These findings provide essential insights for synchrotron experiments operating in this energy range. Furthermore, the proposed measurement protocol offers a reliable method for quantitatively comparing the stability of other high-Z sensor materials against state-of-the-art CdTe technology. |
| Publikationsart: | Article Other literature type |
| ISSN: | 1600-5775 |
| DOI: | 10.1107/s1600577525004576 |
| Zugangs-URL: | https://doaj.org/article/45c5c292c41f486b8eb1002e8813462a |
| Rights: | CC BY URL: http://creativecommons.org/licenses/by/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited. |
| Dokumentencode: | edsair.doi.dedup.....fc437d781adb2b6daaa5d6e925f8d812 |
| Datenbank: | OpenAIRE |
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Nájsť tento článok vo Web of Science | Abstract: | For several years, photon-counting X-ray imaging detectors with cadmium telluride (CdTe) sensors have been used in high-energy synchrotron experiments. While these detectors exhibit excellent detection sensitivity at high energy, concerns remain regarding their performance stability over time under exposure to high-energy X-rays, an issue that can be critical for certain experiments. This study aims to quantitatively assess the response of ohmic-type CdTe sensors under well defined conditions of continuous X-ray irradiation, considering dose rate, photon energy and average absorbed dose throughout the sensor depth. Measurements were performed in a laboratory environment using a dedicated setup with a reliable and reproducible measurement protocol. The results revealed significant irradiation-induced performance variations over time. Notably, a loss of more than 11% in photon counts was observed, even at a relatively low photon flux of 5000 photons s−1 pixel−1 at 49 keV. The key contribution of this work is a quantitative characterization of the behavior of CdTe sensors within the 12–49 keV energy range under controlled conditions. These findings provide essential insights for synchrotron experiments operating in this energy range. Furthermore, the proposed measurement protocol offers a reliable method for quantitatively comparing the stability of other high-Z sensor materials against state-of-the-art CdTe technology. |
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| ISSN: | 16005775 |
| DOI: | 10.1107/s1600577525004576 |