View in EDS

X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper

Saved in:
Bibliographic Details
Title: X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper
Authors: Konovalov, Oleg, Belova, Valentina, La Porta, Francesco, Saedi, Mehdi, Groot, Irene, Renaud, Gilles, Snigireva, Irina, Snigirev, Anatoly, Voevodina, Maria, Shen, Chen, Sartori, Andrea, Murphy, Bridget, Jankowski, Maciej
Contributors: Renaud, Gilles, European Synchrotron Radiation Facility Grenoble (ESRF), Leiden Institute of Chemistry, Universiteit Leiden = Leiden University, Modélisation et Exploration des Matériaux (MEM), Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes (UGA), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Nanostructures et Rayons X (NRX), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes (UGA)-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Immanuel Kant Baltic Federal University (IKBFU), Deutsches Elektronen-Synchrotron Hamburg (DESY), Institut für Experimentelle und Angewandte Physik Kiel (IEAP), Christian-Albrechts-Universität zu Kiel = Christian-Albrechts University of Kiel = Université Christian-Albrechts de Kiel (CAU), Grant 05K19FK2 from the Federal Ministry of Education and Research (BMBF), The Russian Science Foundation, Project No. 19-72-30009, European Project: 736299,LMCat, European Project: 951943,DirectSepa, European Project: 730872,H2020-EU.1.4. - EXCELLENT SCIENCE - Research Infrastructures / H2020-EU.1.4.1.2. - Integrating and opening existing national and regional research infrastructures of European interest,10.3030/730872,CALIPSOplus(2017)
Source: J Synchrotron Radiat
Journal of Synchrotron Radiation, Vol 29, Iss 3, Pp 711-720 (2022)
Journal of synchrotron radiation 29(3), 711-720 (2022). doi:10.1107/S1600577522002053
Journal of Synchrotron Radiation
Publisher Information: International Union of Crystallography (IUCr), 2022.
Publication Year: 2022
Subject Terms: Crystallography, curved surfaces, QC770-798, Research Papers, 01 natural sciences, [PHYS.PHYS.PHYS-CHEM-PH] Physics [physics]/Physics [physics]/Chemical Physics [physics.chem-ph], methods, QD901-999, Nuclear and particle physics. Atomic energy. Radioactivity, x-ray reflectivity, synchrotron, 0103 physical sciences, [PHYS.PHYS.PHYS-CHEM-PH]Physics [physics]/Physics [physics]/Chemical Physics [physics.chem-ph], 0105 earth and related environmental sciences
Description: The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid metals, due to the very high surface tension. Here, the development of X-ray reflectivity measurements with beam sizes of a few tens of micrometres on highly curved liquid surfaces using a synchrotron diffractometer equipped with a double crystal beam deflector is presented. The proposed and developed method, which uses a standard reflectivity θ–2θ scan, is successfully applied to study in situ the bare surface of molten copper and molten copper covered by a graphene layer grown in situ by chemical vapor deposition. It was found that the roughness of the bare liquid surface of copper at 1400 K is 1.25 ± 0.10 Å, while the graphene layer is separated from the liquid surface by a distance of 1.55 ± 0.08 Å and has a roughness of 1.26 ± 0.09 Å.
Document Type: Article
Conference object
Other literature type
File Description: application/pdf
ISSN: 1600-5775
DOI: 10.1107/s1600577522002053
DOI: 10.3204/pubdb-2022-02785
DOI: 10.3204/pubdb-2022-01950
Access URL: https://pubmed.ncbi.nlm.nih.gov/35511004
https://doaj.org/article/80ac1c729a6d4e66bb184ecd5712239d
https://bib-pubdb1.desy.de/record/477589
https://hal.science/hal-03635259v1
https://hal.science/hal-03635259v1/document
https://doi.org/10.1107/s1600577522002053
https://hdl.handle.net/1887/3512613
Rights: CC BY
URL: http://creativecommons.org/licenses/by/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
Accession Number: edsair.doi.dedup.....c26ca919a5e817cf06fe49093348d62f
Database: OpenAIRE
Description
Abstract:The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid metals, due to the very high surface tension. Here, the development of X-ray reflectivity measurements with beam sizes of a few tens of micrometres on highly curved liquid surfaces using a synchrotron diffractometer equipped with a double crystal beam deflector is presented. The proposed and developed method, which uses a standard reflectivity θ–2θ scan, is successfully applied to study in situ the bare surface of molten copper and molten copper covered by a graphene layer grown in situ by chemical vapor deposition. It was found that the roughness of the bare liquid surface of copper at 1400 K is 1.25 ± 0.10 Å, while the graphene layer is separated from the liquid surface by a distance of 1.55 ± 0.08 Å and has a roughness of 1.26 ± 0.09 Å.
ISSN:16005775
DOI:10.1107/s1600577522002053