Cryogenic Ferroelectric Behavior of Wurtzite Ferroelectrics

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Bibliographic Details
Title: Cryogenic Ferroelectric Behavior of Wurtzite Ferroelectrics
Authors: Ruiqing Wang, Jiuren Zhou, Siying Zheng, Feng Zhu, Wenxin Sun, Haiwen Xu, Bochang Li, Yan Liu, Yue Hao, Genquan Han
Source: IEEE Electron Device Letters. 46:1533-1536
Publication Status: Preprint
Publisher Information: Institute of Electrical and Electronics Engineers (IEEE), 2025.
Publication Year: 2025
Subject Terms: Condensed Matter - Materials Science, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, Physics - Applied Physics, Applied Physics (physics.app-ph)
Description: This study presents the first experimental exploration into cryogenic ferroelectric behavior in wurtzite ferroelectrics. A breakdown field (EBD) to coercive field (EC) ratio of 1.8 is achieved even at 4 K, marking the lowest ferroelectric switching temperature reported for wurtzite ferroelectrics. Additionally, a significant evolution in fatigue behavior is captured, transitioning from hard breakdown to ferroelectricity loss at cryogenic temperatures. These findings unlock the feasibility for wurtzite ferroelectrics to advance wide temperature non-volatile memory.
4 pages,6 figures
Document Type: Article
ISSN: 1558-0563
0741-3106
DOI: 10.1109/led.2025.3584071
DOI: 10.48550/arxiv.2504.10221
Access URL: http://arxiv.org/abs/2504.10221
Rights: IEEE Copyright
arXiv Non-Exclusive Distribution
Accession Number: edsair.doi.dedup.....b313acd2d868af32a7267988eba481b1
Database: OpenAIRE
Description
Abstract:This study presents the first experimental exploration into cryogenic ferroelectric behavior in wurtzite ferroelectrics. A breakdown field (EBD) to coercive field (EC) ratio of 1.8 is achieved even at 4 K, marking the lowest ferroelectric switching temperature reported for wurtzite ferroelectrics. Additionally, a significant evolution in fatigue behavior is captured, transitioning from hard breakdown to ferroelectricity loss at cryogenic temperatures. These findings unlock the feasibility for wurtzite ferroelectrics to advance wide temperature non-volatile memory.<br />4 pages,6 figures
ISSN:15580563
07413106
DOI:10.1109/led.2025.3584071