An Improved Thermal Coupling Network Model Considering Thermal Interface Material Aging of IGBT Modules

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Název: An Improved Thermal Coupling Network Model Considering Thermal Interface Material Aging of IGBT Modules
Autoři: Qi Li, Feng Zhang, Li Guan, Xin Zhang, Xiaosong Hu, Yonghe Chen, Jianghui Zhai, Peng Zeng, Baozheng Yang, Shi Cheng, Xianwen Cui, Jian Ye
Zdroj: IEEE Transactions on Components, Packaging and Manufacturing Technology. 15:1672-1681
Informace o vydavateli: Institute of Electrical and Electronics Engineers (IEEE), 2025.
Rok vydání: 2025
Druh dokumentu: Article
ISSN: 2156-3985
2156-3950
DOI: 10.1109/tcpmt.2025.3587813
Rights: IEEE Copyright
Přístupové číslo: edsair.doi...........c9ebcd756ce35ee6964db229cd0b33a8
Databáze: OpenAIRE
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ISSN:21563985
21563950
DOI:10.1109/tcpmt.2025.3587813