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An industrial process fault diagnosis method based on independent slow feature analysis and stacked sparse autoencoder network

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Bibliographic Details
Title:	An industrial process fault diagnosis method based on independent slow feature analysis and stacked sparse autoencoder network
Authors:	Chang Li, Chenglin Wen, Zhe Zhou
Source:	Journal of the Franklin Institute. 361:234-247
Publisher Information:	Elsevier BV, 2024.
Publication Year:	2024
Document Type:	Article
Language:	English
ISSN:	0016-0032
DOI:	10.1016/j.jfranklin.2023.10.004
Rights:	Elsevier TDM
Accession Number:	edsair.doi...........b09d2b146cef30ae9c1fec96df9ddccc
Database:	OpenAIRE

Description
ISSN:	00160032
DOI:	10.1016/j.jfranklin.2023.10.004