Characterization of Diffraction Efficiency for X-ray Analyzer Crystals Using a Laboratory-Based Primary Diffraction Photon Method

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Titel: Characterization of Diffraction Efficiency for X-ray Analyzer Crystals Using a Laboratory-Based Primary Diffraction Photon Method
Autoren: Yue Li, renzhou zheng, pengfei qiang, yongqing yan, Lizhi Sheng
Quelle: Applied Optics.
Verlagsinformationen: Optica Publishing Group, 2025.
Publikationsjahr: 2025
Publikationsart: Article
Sprache: English
ISSN: 2155-3165
1559-128X
DOI: 10.1364/ao.575231
Dokumentencode: edsair.doi...........a59636642ed825cdc67e821ff20c2f9e
Datenbank: OpenAIRE
Beschreibung
ISSN:21553165
1559128X
DOI:10.1364/ao.575231