Cost-Optimized Double-Node-Upset-Recovery Latch Designs With Aging Mitigation and Algorithm-Based Verification for Long-Term Robustness Enhancement
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| Název: | Cost-Optimized Double-Node-Upset-Recovery Latch Designs With Aging Mitigation and Algorithm-Based Verification for Long-Term Robustness Enhancement |
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| Autoři: | Aibin Yan, Changli Hu, Jing Li, Na Bai, Zhengfeng Huang, Tianming Ni, Girard Patrick, Xiaoqing Wen |
| Zdroj: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 33:1765-1773 |
| Informace o vydavateli: | Institute of Electrical and Electronics Engineers (IEEE), 2025. |
| Rok vydání: | 2025 |
| Druh dokumentu: | Article |
| ISSN: | 1557-9999 1063-8210 |
| DOI: | 10.1109/tvlsi.2025.3554117 |
| Rights: | IEEE Copyright |
| Přístupové číslo: | edsair.doi...........69c5f3082d4c1e9d76fa252a1dbcbe7e |
| Databáze: | OpenAIRE |
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Nájsť tento článok vo Web of Science | ISSN: | 15579999 10638210 |
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| DOI: | 10.1109/tvlsi.2025.3554117 |