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Compression of VLSI test data by arithmetic coding.

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Název: Compression of VLSI test data by arithmetic coding.
Autoři: Hashempour, H., Lombardi, F.
Zdroj: Proceedings of the 19th IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems, 2004. DFT 2004; 2004, p150-157, 8p
Databáze: Complementary Index
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