Compression of VLSI test data by arithmetic coding.

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Titel: Compression of VLSI test data by arithmetic coding.
Autoren: Hashempour, H., Lombardi, F.
Quelle: Proceedings of the 19th IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems, 2004. DFT 2004; 2004, p150-157, 8p
Datenbank: Complementary Index
Beschreibung
ISBN:9780769522418
DOI:10.1109/DFTVS.2004.1347835