Hashempour, H., & Lombardi, F. (2004). Compression of VLSI test data by arithmetic coding. Proceedings of the 19th IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems, 2004. DFT 2004, 150-157. https://doi.org/10.1109/DFTVS.2004.1347835
Citace podle Chicago (17th ed.)Hashempour, H., a F. Lombardi. "Compression of VLSI Test Data by Arithmetic Coding." Proceedings of the 19th IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems, 2004. DFT 2004 2004: 150-157. https://doi.org/10.1109/DFTVS.2004.1347835.
Citace podle MLA (9th ed.)Hashempour, H., a F. Lombardi. "Compression of VLSI Test Data by Arithmetic Coding." Proceedings of the 19th IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems, 2004. DFT 2004, 2004, pp. 150-157, https://doi.org/10.1109/DFTVS.2004.1347835.