Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs.
Uloženo v:
| Název: | Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs. |
|---|---|
| Autoři: | Ma, Yuhai, Shi, Wanchun |
| Zdroj: | Journal of Electronic Testing; Jun1999, Vol. 14 Issue 3, p273-293, 21p |
| Abstrakt: | Today's microelectronics researchers design VLSI devices to achieve highly differentiated devices, both in performance and functionality. As VLSI devices become more complex, VLSI device testing becomes more costly and time consuming. The increasing test complexity leads to longer device test programs development time as well as more expensive test systems, and debugging test programs is a great burden to the test programs development. On the other hand, there is little formal theory of debugging, and attempts to develop a methodology of debugging are rare. The aim of the investigation in this paper is to create a theory to support analysis and debugging of VLSI device test programs, and then, on the basis of this theory, design and develop an off-line debugging environment, OLDEVDTP, for the creation, analysis, checking, identifying, error location, and correction of the device test programs off-line from the target VLSI test system, to achieve a dramatic cost and time reduction. In the paper, fuzzy comprehensive evaluation techniques are applied to the program analysis and debugging process to reduce restrictions caused by computational complexity. Analysis, design, and implementation of OLDEVDTP are also addressed in the paper. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Electronic Testing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Databáze: | Complementary Index |
Full Text Finder 
Nájsť tento článok vo Web of Science | Abstrakt: | Today's microelectronics researchers design VLSI devices to achieve highly differentiated devices, both in performance and functionality. As VLSI devices become more complex, VLSI device testing becomes more costly and time consuming. The increasing test complexity leads to longer device test programs development time as well as more expensive test systems, and debugging test programs is a great burden to the test programs development. On the other hand, there is little formal theory of debugging, and attempts to develop a methodology of debugging are rare. The aim of the investigation in this paper is to create a theory to support analysis and debugging of VLSI device test programs, and then, on the basis of this theory, design and develop an off-line debugging environment, OLDEVDTP, for the creation, analysis, checking, identifying, error location, and correction of the device test programs off-line from the target VLSI test system, to achieve a dramatic cost and time reduction. In the paper, fuzzy comprehensive evaluation techniques are applied to the program analysis and debugging process to reduce restrictions caused by computational complexity. Analysis, design, and implementation of OLDEVDTP are also addressed in the paper. [ABSTRACT FROM AUTHOR] |
|---|---|
| ISSN: | 09238174 |
| DOI: | 10.1023/A:1008318421537 |