Inamanamelluri, S., Dhanasekaran, D., & Baskar, R. (2024). Design a self-controlled high-performance evaluation of content addressable memories using 45 nm technology. Indonesian Journal of Electrical Engineering & Computer Science, 33(3), 1397-1404. https://doi.org/10.11591/ijeecs.v33.i3.pp1397-1404
Chicago Style (17th ed.) CitationInamanamelluri, Saidulu, Devaraj Dhanasekaran, and Radhika Baskar. "Design a Self-controlled High-performance Evaluation of Content Addressable Memories Using 45 Nm Technology." Indonesian Journal of Electrical Engineering & Computer Science 33, no. 3 (2024): 1397-1404. https://doi.org/10.11591/ijeecs.v33.i3.pp1397-1404.
MLA (9th ed.) CitationInamanamelluri, Saidulu, et al. "Design a Self-controlled High-performance Evaluation of Content Addressable Memories Using 45 Nm Technology." Indonesian Journal of Electrical Engineering & Computer Science, vol. 33, no. 3, 2024, pp. 1397-1404, https://doi.org/10.11591/ijeecs.v33.i3.pp1397-1404.