Bibliographische Detailangaben
| Titel: |
Features of FeB pair light-induced dissociation and repair in silicon n+-p-p+ structures under ultrasound loading. |
| Autoren: |
Olikh, O., Kostylyov, V., Vlasiuk, V., Korkishko, R., Olikh, Ya., Chupryna, R. |
| Quelle: |
Journal of Applied Physics; 12/21/2021, Vol. 130 Issue 23, p1-9, 9p |
| Schlagwörter: |
ULTRASONIC imaging, SOUND waves, SHORT circuits, SILICON, OCEAN wave power, COLLISION induced dissociation |
| Abstract: |
The experimental research in ultrasound impact on iron–boron pair transformation in silicon n + - p - p + structures has revealed the decrease in concentration of pairs dissociated by light, as well as in the time of pair associations. The FeB pair changes were monitored by measuring short circuit current kinetics. The ultrasound influence was investigated at different light intensities, temperatures, frequencies, and power of acoustic waves. The possible mechanisms underlying the revealed effects were analyzed. [ABSTRACT FROM AUTHOR] |
|
Copyright of Journal of Applied Physics is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Datenbank: |
Complementary Index |
Nájsť tento článok vo Web of Science