Diffraction-Based Multiscale Residual Strain Measurements.
Uloženo v:
| Název: | Diffraction-Based Multiscale Residual Strain Measurements. |
|---|---|
| Autoři: | Pai N; Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology Bombay, Mumbai 400076, India., Manda S; Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology Bombay, Mumbai 400076, India., Sudhalkar B; Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology Bombay, Mumbai 400076, India., Syphus B; Mechanical Engineering, Brigham Young University, Provo, UT 84602, USA., Fullwood D; Mechanical Engineering, Brigham Young University, Provo, UT 84602, USA., de Kloe R; Gatan-Edax, Ringbaan Noord 103, 5046 AA Tilburg, The Netherlands., Wright S; Gatan-Edax, 5794 W. Las Positas Blvd., Pleasanton, CA 94588, USA., Patra A; Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology Bombay, Mumbai 400076, India., Samajdar I; Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology Bombay, Mumbai 400076, India. |
| Zdroj: | Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2024 Apr 29; Vol. 30 (2), pp. 236-252. |
| Způsob vydávání: | Journal Article |
| Jazyk: | English |
| Informace o časopise: | Publisher: Oxford University Press Country of Publication: England NLM ID: 9712707 Publication Model: Print Cited Medium: Internet ISSN: 1435-8115 (Electronic) Linking ISSN: 14319276 NLM ISO Abbreviation: Microsc Microanal Subsets: PubMed not MEDLINE; MEDLINE |
| Imprint Name(s): | Publication: 2023- : [Oxford] : Oxford University Press Original Publication: New York, N.Y. : Springer-Verlag New York, 1997- |
| Abstrakt: | Modern analytical tools, from microfocus X-ray diffraction (XRD) to electron microscopy-based microtexture measurements, offer exciting possibilities of diffraction-based multiscale residual strain measurements. The different techniques differ in scale and resolution, but may also yield significantly different strain values. This study, for example, clearly established that high-resolution electron backscattered diffraction (HR-EBSD) and high-resolution transmission Kikuchi diffraction (HR-TKD) [sensitive to changes in interplanar angle (Δθθ)], provide quantitatively higher residual strains than micro-Laue XRD and transmission electron microscope (TEM) based precession electron diffraction (PED) [sensitive to changes in interplanar spacing (Δdd)]. Even after correcting key known factors affecting the accuracy of HR-EBSD strain measurements, a scaling factor of ∼1.57 (between HR-EBSD and micro-Laue) emerged. We have then conducted "virtual" experiments by systematically deforming an ideal lattice by either changing an interplanar angle (α) or a lattice parameter (a). The patterns were kinematically and dynamically simulated, and corresponding strains were measured by HR-EBSD. These strains showed consistently higher values for lattice(s) distorted by α, than those altered by a. The differences in strain measurements were further emphasized by mapping identical location with HR-TKD and TEM-PED. These measurements exhibited different spatial resolution, but when scaled (with ∼1.57) provided similar lattice distortions numerically. (© The Author(s) 2024. Published by Oxford University Press on behalf of the Microscopy Society of America. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.) |
| Competing Interests: | Conflict of Interest: The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper. |
| Contributed Indexing: | Keywords: X-ray diffraction (XRD); diffraction pattern simulation; high resolution EBSD (HR-EBSD); residual strain; transmission electron microscopy |
| Entry Date(s): | Date Created: 20240306 Latest Revision: 20240429 |
| Update Code: | 20250114 |
| DOI: | 10.1093/mam/ozae011 |
| PMID: | 38447180 |
| Databáze: | MEDLINE |
Full Text Finder 
Nájsť tento článok vo Web of Science | Abstrakt: | Modern analytical tools, from microfocus X-ray diffraction (XRD) to electron microscopy-based microtexture measurements, offer exciting possibilities of diffraction-based multiscale residual strain measurements. The different techniques differ in scale and resolution, but may also yield significantly different strain values. This study, for example, clearly established that high-resolution electron backscattered diffraction (HR-EBSD) and high-resolution transmission Kikuchi diffraction (HR-TKD) [sensitive to changes in interplanar angle (Δθθ)], provide quantitatively higher residual strains than micro-Laue XRD and transmission electron microscope (TEM) based precession electron diffraction (PED) [sensitive to changes in interplanar spacing (Δdd)]. Even after correcting key known factors affecting the accuracy of HR-EBSD strain measurements, a scaling factor of ∼1.57 (between HR-EBSD and micro-Laue) emerged. We have then conducted "virtual" experiments by systematically deforming an ideal lattice by either changing an interplanar angle (α) or a lattice parameter (a). The patterns were kinematically and dynamically simulated, and corresponding strains were measured by HR-EBSD. These strains showed consistently higher values for lattice(s) distorted by α, than those altered by a. The differences in strain measurements were further emphasized by mapping identical location with HR-TKD and TEM-PED. These measurements exhibited different spatial resolution, but when scaled (with ∼1.57) provided similar lattice distortions numerically.<br /> (© The Author(s) 2024. Published by Oxford University Press on behalf of the Microscopy Society of America. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.) |
|---|---|
| ISSN: | 1435-8115 |
| DOI: | 10.1093/mam/ozae011 |