Zobraziť v EDS

A Patent Data Meta-Path-based Technological Risk Prediction Method.

Uložené v:
Podrobná bibliografia
Názov: A Patent Data Meta-Path-based Technological Risk Prediction Method.
Autori: Liu, Weidong1 (AUTHOR) cslwd@imu.edu.cn, Zhang, Jiamin2 (AUTHOR) cszjm@mail.imu.edu.cn, Yang, Yuling2 (AUTHOR) csyyl@mail.imu.edu.cn, Ye, Fuming2 (AUTHOR) csyfm@mail.imu.edu.cn
Zdroj: International Journal of Software Engineering & Knowledge Engineering. Nov2025, Vol. 35 Issue 11, p1533-1554. 22p.
Predmety: *RISK assessment, *PATENT databases, *TECHNOLOGICAL complexity, TECHNOLOGICAL risk assessment, COMPUTATIONAL complexity, TECHNOLOGY management
Abstrakt: Although many countries have achieved rapid advancements in science and technology, they still rely on other nations in certain key technological fields. Effective prediction of technological risks is vital for national economic growth. Recently, countries have placed a strong emphasis on technological security. Technological risks arise from factors such as technology itself, its environment and management. Predicting these risks helps nations, enterprises and institutions achieve independent and controllable technology. It also enables effective management and control of potential risks. Risk prediction research encounters challenges such as technological diversity and the complexity of technological risks. To address the above issues, we propose a patent data meta-path-based technological risk prediction method. This method takes into account both technological diversity and the complexity of technological risks when predicting risks. Technological risk prediction involves analyzing potential risks and their degrees of severity in technological development. Compared to the baseline methods using our collected patent data, our method performs better in evaluation metrics, demonstrating its applicability in predicting technological risks. [ABSTRACT FROM AUTHOR]
Copyright of International Journal of Software Engineering & Knowledge Engineering is the property of World Scientific Publishing Company and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Databáza: Business Source Index
Popis
Abstrakt:Although many countries have achieved rapid advancements in science and technology, they still rely on other nations in certain key technological fields. Effective prediction of technological risks is vital for national economic growth. Recently, countries have placed a strong emphasis on technological security. Technological risks arise from factors such as technology itself, its environment and management. Predicting these risks helps nations, enterprises and institutions achieve independent and controllable technology. It also enables effective management and control of potential risks. Risk prediction research encounters challenges such as technological diversity and the complexity of technological risks. To address the above issues, we propose a patent data meta-path-based technological risk prediction method. This method takes into account both technological diversity and the complexity of technological risks when predicting risks. Technological risk prediction involves analyzing potential risks and their degrees of severity in technological development. Compared to the baseline methods using our collected patent data, our method performs better in evaluation metrics, demonstrating its applicability in predicting technological risks. [ABSTRACT FROM AUTHOR]
ISSN:02181940
DOI:10.1142/S0218194025410013