Sarkar, T. S., Maitra, S., Chakraborty, A., Bhattacharya, S., & Mukhopadhyay, D. (2025, October 26). TREX-F: TRustability of Electronics using X-ray based Fingerprinting. Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design, 1-9. https://doi.org/10.1109/ICCAD66269.2025.11240899
Citace podle Chicago (17th ed.)Sarkar, Tishya Sarma, Shuvodip Maitra, Abhishek Chakraborty, Sarani Bhattacharya, a Debdeep Mukhopadhyay. "TREX-F: TRustability of Electronics Using X-ray Based Fingerprinting." Digest of Technical Papers - IEEE/ACM International Conference on Computer-Aided Design 26 Oct. 2025: 1-9. https://doi.org/10.1109/ICCAD66269.2025.11240899.
Citace podle MLA (9th ed.)Sarkar, Tishya Sarma, et al. "TREX-F: TRustability of Electronics Using X-ray Based Fingerprinting." Digest of Technical Papers - IEEE/ACM International Conference on Computer-Aided Design, 26 Oct. 2025, pp. 1-9, https://doi.org/10.1109/ICCAD66269.2025.11240899.