Modelling SoC devices for virtual test using VHDL

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Bibliographic Details
Published in:Proceedings of the conference on Design, automation and test in Europe pp. 770 - 771
Main Authors: Rona, M., Krampl, G.
Format: Conference Proceeding
Language:English
Published: Piscataway, NJ, USA IEEE Press 13.03.2001
Series:ACM Conferences
Subjects:
ISBN:9780769509938, 0769509932
Online Access:Get full text
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ISBN:9780769509938
0769509932
DOI:10.5555/367072.367966