APA (7th ed.) Citation

Tseng, Y., Lu, L., Shen, F., Wang, C., Sung, H., Chang, W., & Wu, W. (2022). In Situ Atomic‐Scale Observation of Monolayer MoS2 Devices under High‐Voltage Biasing via Transmission Electron Microscopy. Small (Weinheim an der Bergstrasse, Germany), 18(7), e2106411-n/a. https://doi.org/10.1002/smll.202106411

Chicago Style (17th ed.) Citation

Tseng, Yi‐Tang, Li‐Syuan Lu, Fang‐Chun Shen, Che‐Hung Wang, Hsin‐Ya Sung, Wen‐Hao Chang, and Wen‐Wei Wu. "In Situ Atomic‐Scale Observation of Monolayer MoS2 Devices Under High‐Voltage Biasing via Transmission Electron Microscopy." Small (Weinheim an Der Bergstrasse, Germany) 18, no. 7 (2022): e2106411-n/a. https://doi.org/10.1002/smll.202106411.

MLA (9th ed.) Citation

Tseng, Yi‐Tang, et al. "In Situ Atomic‐Scale Observation of Monolayer MoS2 Devices Under High‐Voltage Biasing via Transmission Electron Microscopy." Small (Weinheim an Der Bergstrasse, Germany), vol. 18, no. 7, 2022, pp. e2106411-n/a, https://doi.org/10.1002/smll.202106411.