Tseng, Y., Lu, L., Shen, F., Wang, C., Sung, H., Chang, W., & Wu, W. (2022). In Situ Atomic‐Scale Observation of Monolayer MoS2 Devices under High‐Voltage Biasing via Transmission Electron Microscopy. Small (Weinheim an der Bergstrasse, Germany), 18(7), e2106411-n/a. https://doi.org/10.1002/smll.202106411
Chicago-Zitierstil (17. Ausg.)Tseng, Yi‐Tang, Li‐Syuan Lu, Fang‐Chun Shen, Che‐Hung Wang, Hsin‐Ya Sung, Wen‐Hao Chang, und Wen‐Wei Wu. "In Situ Atomic‐Scale Observation of Monolayer MoS2 Devices Under High‐Voltage Biasing via Transmission Electron Microscopy." Small (Weinheim an Der Bergstrasse, Germany) 18, no. 7 (2022): e2106411-n/a. https://doi.org/10.1002/smll.202106411.
MLA-Zitierstil (9. Ausg.)Tseng, Yi‐Tang, et al. "In Situ Atomic‐Scale Observation of Monolayer MoS2 Devices Under High‐Voltage Biasing via Transmission Electron Microscopy." Small (Weinheim an Der Bergstrasse, Germany), vol. 18, no. 7, 2022, pp. e2106411-n/a, https://doi.org/10.1002/smll.202106411.