Within-Project and Cross-Project Software Defect Prediction Based on Improved Transfer Naive Bayes Algorithm
With the continuous expansion of software scale, software update and maintenance have become more and more important. However, frequent software code updates will make the software more likely to introduce new defects. So how to predict the defects quickly and accurately on the software change has b...
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| Published in: | Computers, materials & continua Vol. 63; no. 2; p. 891 |
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| Main Authors: | , , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
Henderson
Tech Science Press
01.01.2020
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| Subjects: | |
| ISSN: | 1546-2218, 1546-2226 |
| Online Access: | Get full text |
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