Within-Project and Cross-Project Software Defect Prediction Based on Improved Transfer Naive Bayes Algorithm

With the continuous expansion of software scale, software update and maintenance have become more and more important. However, frequent software code updates will make the software more likely to introduce new defects. So how to predict the defects quickly and accurately on the software change has b...

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Bibliographic Details
Published in:Computers, materials & continua Vol. 63; no. 2; p. 891
Main Authors: Zhu, Kun, Zhang, Nana, Shi, Ying, Wang, Xu
Format: Journal Article
Language:English
Published: Henderson Tech Science Press 01.01.2020
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ISSN:1546-2218, 1546-2226
Online Access:Get full text
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