Citace podle APA (7th ed.)

Zhu, K., Zhang, N., Shi, Y., & Wang, X. (2020). Within-Project and Cross-Project Software Defect Prediction Based on Improved Transfer Naive Bayes Algorithm. Computers, materials & continua, 63(2), 891. https://doi.org/10.32604/cmc.2020.08096

Citace podle Chicago (17th ed.)

Zhu, Kun, Nana Zhang, Ying Shi, a Xu Wang. "Within-Project and Cross-Project Software Defect Prediction Based on Improved Transfer Naive Bayes Algorithm." Computers, Materials & Continua 63, no. 2 (2020): 891. https://doi.org/10.32604/cmc.2020.08096.

Citace podle MLA (9th ed.)

Zhu, Kun, et al. "Within-Project and Cross-Project Software Defect Prediction Based on Improved Transfer Naive Bayes Algorithm." Computers, Materials & Continua, vol. 63, no. 2, 2020, p. 891, https://doi.org/10.32604/cmc.2020.08096.

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