2010 IEEE Conference on Computer Vision and Pattern Recognition : San Francisco, California, USA, 13-18 June 2010
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
Piscataway, N.J
IEEE
2010
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| ISBN: | 1424469848, 9781424469840 |
| Online Access: | Get full text |
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