2007 IEEE Conference on Computer Vision and Pattern Recognition : 17-22 June, 2007, Minneapolis, MN

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Bibliographic Details
Main Authors: IEEE Conference on Computer Vision and Pattern Recognition, Baker, Simon, Matas, Jiri, Zabih, Ramin, Kanada, Takeo, Medioni, Gerard
Format: Book
Language:English
Published: Piscataway, N.J IEEE Service Center 2007
ISBN:9781424411795, 1424411793
Online Access:Get full text
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Description
Bibliography:"IEEE catalog number 07CH37898"--T.p. verso
Includes bibliographical references
Index: p. A1-A12
ISBN:9781424411795
1424411793