Recognition, I. C. o. C. V. a. P., Baker, S., Matas, J., Zabih, R., Kanada, T., & Medioni, G. (2007). 2007 IEEE Conference on Computer Vision and Pattern Recognition: 17-22 June, 2007, Minneapolis, MN. IEEE Service Center.
Chicago-Zitierstil (17. Ausg.)Recognition, IEEE Conference on Computer Vision and Pattern, Simon Baker, Jiri Matas, Ramin Zabih, Takeo Kanada, und Gerard Medioni. 2007 IEEE Conference on Computer Vision and Pattern Recognition: 17-22 June, 2007, Minneapolis, MN. Piscataway, N.J: IEEE Service Center, 2007.
MLA-Zitierstil (9. Ausg.)Recognition, IEEE Conference on Computer Vision and Pattern, et al. 2007 IEEE Conference on Computer Vision and Pattern Recognition: 17-22 June, 2007, Minneapolis, MN. IEEE Service Center, 2007.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.