A simple metric that correlates with public Wi‐Fi throughput

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Bibliographic Details
Published in:	Electronics Letters Vol. 59
Main Authors:	Yu Mizuno, Yasuhiro Ohishi, Naoki Ishikawa
Format:	Journal Article
Language:	Japanese
Published:	Institution of Engineering and Technology (IET) 01.04.2023
Subjects:	Electrical engineering. Electronics. Nuclear engineering quality of service TK1-9971 wireless LAN
ISSN:	0013-5194, 1350-911X
Online Access:	Get full text
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