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Bibliographic Details
Published in:IEEE Access Vol. 12; pp. i - xi
Main Authors: Derek Abbott, Sonia Aissa, Anuradha Annaswamy, Nirwan Ansari, Jun Cai, Kun-Shan Chen, Yixin Chen, J.-C. Chiao, Ayman El-Baz, Shaikh Fattah, Hoay Gooi, Maya Gokhale, Chih-Lin I, Giuseppe Iannaccone, Yumi Iwashita, Bruce Jacob, Abbas Jamalipour, Bahram Javidi, Weihua Jiang, Okyay Kaynak, Hulya Kirkici, Germano Lambert-Torres, Shengtao Li, Michal Mrozowski, Michele Nappi, Dalma Novak, Hugo Proenca, Yi Qian, Zhihua Qu, Susanto Rahardja, Mehrdad Saif, Ali Serpenguzel, Peter H. Siegel, Ashitey Trebi-Ollennu, Daniela Tuninetti, Ge Wang, Keith A. Wear, Andreas Weisshaar, C. Patrick Yue, Enrico Zio
Format: Journal Article
Language:Japanese
Published: Institute of Electrical and Electronics Engineers (IEEE) 01.01.2024
Subjects:
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
ISSN:2169-3536
Online Access:Get full text
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ISSN:2169-3536
DOI:10.1109/access.2024.3351510